Post-Silicon Validation and Debug

Post-Silicon Validation and Debug

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  • Author: Prabhat Mishra
  • Publisher: Springer
  • ISBN: 3319981161
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 394

This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.


System-on-Chip Security

System-on-Chip Security

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  • Author: Farimah Farahmandi
  • Publisher: Springer Nature
  • ISBN: 3030305961
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 295

This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.


Fundamentals of IP and SoC Security

Fundamentals of IP and SoC Security

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  • Author: Swarup Bhunia
  • Publisher: Springer
  • ISBN: 3319500570
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 316

This book is about security in embedded systems and it provides an authoritative reference to all aspects of security in system-on-chip (SoC) designs. The authors discuss issues ranging from security requirements in SoC designs, definition of architectures and design choices to enforce and validate security policies, and trade-offs and conflicts involving security, functionality, and debug requirements. Coverage also includes case studies from the “trenches” of current industrial practice in design, implementation, and validation of security-critical embedded systems. Provides an authoritative reference and summary of the current state-of-the-art in security for embedded systems, hardware IPs and SoC designs; Takes a "cross-cutting" view of security that interacts with different design and validation components such as architecture, implementation, verification, and debug, each enforcing unique trade-offs; Includes high-level overview, detailed analysis on implementation, and relevant case studies on design/verification/debug issues related to IP/SoC security.


On-Chip Instrumentation

On-Chip Instrumentation

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  • Author: Neal Stollon
  • Publisher: Springer Science & Business Media
  • ISBN: 1441975632
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 244

This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.


Design for Testability, Debug and Reliability

Design for Testability, Debug and Reliability

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  • Author: Sebastian Huhn
  • Publisher: Springer Nature
  • ISBN: 3030692094
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 164

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.


Trace-Based Post-Silicon Validation for VLSI Circuits

Trace-Based Post-Silicon Validation for VLSI Circuits

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  • Author: Xiao Liu
  • Publisher: Springer Science & Business Media
  • ISBN: 3319005332
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 108

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.


Formal Verification

Formal Verification

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  • Author: Erik Seligman
  • Publisher: Elsevier
  • ISBN: 0323956130
  • Category : Computers
  • Languages : en
  • Pages : 428

Formal Verification: An Essential Toolkit for Modern VLSI Design, Second Edition presents practical approaches for design and validation, with hands-on advice to help working engineers integrate these techniques into their work. Formal Verification (FV) enables a designer to directly analyze and mathematically explore the quality or other aspects of a Register Transfer Level (RTL) design without using simulations. This can reduce time spent validating designs and more quickly reach a final design for manufacturing. Building on a basic knowledge of SystemVerilog, this book demystifies FV and presents the practical applications that are bringing it into mainstream design and validation processes. Every chapter in the second edition has been updated to reflect evolving FV practices and advanced techniques. In addition, a new chapter, Formal Signoff on Real Projects, provides guidelines for implementing signoff quality FV, completely replacing some simulation tasks with significantly more productive FV methods. After reading this book, readers will be prepared to introduce FV in their organization to effectively deploy FV techniques that increase design and validation productivity. Covers formal verification algorithms that help users gain full coverage without exhaustive simulation Helps readers understand formal verification tools and how they differ from simulation tools Shows how to create instant testbenches to gain insights into how models work and to find initial bugs Presents insights from Intel insiders who share their hard-won knowledge and solutions to complex design problems


Network-on-Chip Security and Privacy

Network-on-Chip Security and Privacy

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  • Author: Prabhat Mishra
  • Publisher: Springer Nature
  • ISBN: 3030691314
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 496

This book provides comprehensive coverage of Network-on-Chip (NoC) security vulnerabilities and state-of-the-art countermeasures, with contributions from System-on-Chip (SoC) designers, academic researchers and hardware security experts. Readers will gain a clear understanding of the existing security solutions for on-chip communication architectures and how they can be utilized effectively to design secure and trustworthy systems.


High Speed Digital Design

High Speed Digital Design

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  • Author: Hanqiao Zhang
  • Publisher: Elsevier
  • ISBN: 012418667X
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 272

High Speed Digital Design discusses the major factors to consider in designing a high speed digital system and how design concepts affect the functionality of the system as a whole. It will help you understand why signals act so differently on a high speed digital system, identify the various problems that may occur in the design, and research solutions to minimize their impact and address their root causes. The authors offer a strong foundation that will help you get high speed digital system designs right the first time. Taking a systems design approach, High Speed Digital Design offers a progression from fundamental to advanced concepts, starting with transmission line theory, covering core concepts as well as recent developments. It then covers the challenges of signal and power integrity, offers guidelines for channel modeling, and optimizing link circuits. Tying together concepts presented throughout the book, the authors present Intel processors and chipsets as real-world design examples. Provides knowledge and guidance in the design of high speed digital circuits Explores the latest developments in system design Covers everything that encompasses a successful printed circuit board (PCB) product Offers insight from Intel insiders about real-world high speed digital design


Post-Silicon and Runtime Verification for Modern Processors

Post-Silicon and Runtime Verification for Modern Processors

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  • Author: Ilya Wagner
  • Publisher: Springer Science & Business Media
  • ISBN: 1441980342
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 224

The purpose of this book is to survey the state of the art and evolving directions in post-silicon and runtime verification. The authors start by giving an overview of the state of the art in verification, particularly current post-silicon methodologies in use in the industry, both for the domain of processor pipeline design and for memory subsystems. They then dive into the presentation of several new post-silicon verification solutions aimed at boosting the verification coverage of modern processors, dedicating several chapters to this topic. The presentation of runtime verification solutions follows a similar approach. This is an area of processor design that is still in its early stages of exploration and that holds the promise of accomplishing the ultimate goal of achieving complete correctness guarantees for microprocessor-based computation. The authors conclude the book with a look towards the future of late-stage verification and its growing role in the processor life-cycle.