PDF Semiconductor Measurement Technology Download
- Author: United States. National Bureau of Standards
- Publisher:
- ISBN:
- Category : Semiconductors
- Languages : en
- Pages : 124
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Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay