Post-Silicon Validation and Debug

2018-09-01
Post-Silicon Validation and Debug

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  • Author: Prabhat Mishra
  • Publisher: Springer
  • ISBN: 3319981161
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 394

This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.

System-on-Chip Security

2019-11-22
System-on-Chip Security

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  • Author: Farimah Farahmandi
  • Publisher: Springer Nature
  • ISBN: 3030305961
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 295

This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.

Trace-Based Post-Silicon Validation for VLSI Circuits

2013-06-12
Trace-Based Post-Silicon Validation for VLSI Circuits

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  • Author: Xiao Liu
  • Publisher: Springer Science & Business Media
  • ISBN: 3319005332
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 108

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

Fundamentals of IP and SoC Security

2017-01-24
Fundamentals of IP and SoC Security

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  • Author: Swarup Bhunia
  • Publisher: Springer
  • ISBN: 3319500570
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 316

This book is about security in embedded systems and it provides an authoritative reference to all aspects of security in system-on-chip (SoC) designs. The authors discuss issues ranging from security requirements in SoC designs, definition of architectures and design choices to enforce and validate security policies, and trade-offs and conflicts involving security, functionality, and debug requirements. Coverage also includes case studies from the “trenches” of current industrial practice in design, implementation, and validation of security-critical embedded systems. Provides an authoritative reference and summary of the current state-of-the-art in security for embedded systems, hardware IPs and SoC designs; Takes a "cross-cutting" view of security that interacts with different design and validation components such as architecture, implementation, verification, and debug, each enforcing unique trade-offs; Includes high-level overview, detailed analysis on implementation, and relevant case studies on design/verification/debug issues related to IP/SoC security.

VLSI Design and Test

2017-12-21
VLSI Design and Test

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  • Author: Brajesh Kumar Kaushik
  • Publisher: Springer
  • ISBN: 9811074704
  • Category : Computers
  • Languages : en
  • Pages : 815

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

On-Chip Instrumentation

2010-12-06
On-Chip Instrumentation

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  • Author: Neal Stollon
  • Publisher: Springer Science & Business Media
  • ISBN: 1441975632
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 244

This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.

Comprehensive Functional Verification

2005-05-26
Comprehensive Functional Verification

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  • Author: Bruce Wile
  • Publisher: Elsevier
  • ISBN: 0080476643
  • Category : Computers
  • Languages : en
  • Pages : 702

One of the biggest challenges in chip and system design is determining whether the hardware works correctly. That is the job of functional verification engineers and they are the audience for this comprehensive text from three top industry professionals.As designs increase in complexity, so has the value of verification engineers within the hardware design team. In fact, the need for skilled verification engineers has grown dramatically--functional verification now consumes between 40 and 70% of a project's labor, and about half its cost. Currently there are very few books on verification for engineers, and none that cover the subject as comprehensively as this text. A key strength of this book is that it describes the entire verification cycle and details each stage. The organization of the book follows the cycle, demonstrating how functional verification engages all aspects of the overall design effort and how individual cycle stages relate to the larger design process. Throughout the text, the authors leverage their 35 plus years experience in functional verification, providing examples and case studies, and focusing on the skills, methods, and tools needed to complete each verification task. Comprehensive overview of the complete verification cycle Combines industry experience with a strong emphasis on functional verification fundamentals Includes real-world case studies

Post-Silicon and Runtime Verification for Modern Processors

2010-11-25
Post-Silicon and Runtime Verification for Modern Processors

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  • Author: Ilya Wagner
  • Publisher: Springer Science & Business Media
  • ISBN: 1441980342
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 224

The purpose of this book is to survey the state of the art and evolving directions in post-silicon and runtime verification. The authors start by giving an overview of the state of the art in verification, particularly current post-silicon methodologies in use in the industry, both for the domain of processor pipeline design and for memory subsystems. They then dive into the presentation of several new post-silicon verification solutions aimed at boosting the verification coverage of modern processors, dedicating several chapters to this topic. The presentation of runtime verification solutions follows a similar approach. This is an area of processor design that is still in its early stages of exploration and that holds the promise of accomplishing the ultimate goal of achieving complete correctness guarantees for microprocessor-based computation. The authors conclude the book with a look towards the future of late-stage verification and its growing role in the processor life-cycle.

Formal Verification

2023-05-26
Formal Verification

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  • Author: Erik Seligman
  • Publisher: Elsevier
  • ISBN: 0323956130
  • Category : Computers
  • Languages : en
  • Pages : 428

Formal Verification: An Essential Toolkit for Modern VLSI Design, Second Edition presents practical approaches for design and validation, with hands-on advice to help working engineers integrate these techniques into their work. Formal Verification (FV) enables a designer to directly analyze and mathematically explore the quality or other aspects of a Register Transfer Level (RTL) design without using simulations. This can reduce time spent validating designs and more quickly reach a final design for manufacturing. Building on a basic knowledge of SystemVerilog, this book demystifies FV and presents the practical applications that are bringing it into mainstream design and validation processes. Every chapter in the second edition has been updated to reflect evolving FV practices and advanced techniques. In addition, a new chapter, Formal Signoff on Real Projects, provides guidelines for implementing signoff quality FV, completely replacing some simulation tasks with significantly more productive FV methods. After reading this book, readers will be prepared to introduce FV in their organization to effectively deploy FV techniques that increase design and validation productivity. Covers formal verification algorithms that help users gain full coverage without exhaustive simulation Helps readers understand formal verification tools and how they differ from simulation tools Shows how to create instant testbenches to gain insights into how models work and to find initial bugs Presents insights from Intel insiders who share their hard-won knowledge and solutions to complex design problems

Debug Automation from Pre-Silicon to Post-Silicon

2014-09-25
Debug Automation from Pre-Silicon to Post-Silicon

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  • Author: Mehdi Dehbashi
  • Publisher: Springer
  • ISBN: 3319093096
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 171

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.